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A dynamical theory of low-energy electron diffraction (LEED) is applied to the determination of the geometry of the 2*1-reconstructed (111) surface of silicon from experimental LEED intensity versus energy profiles. The top layer is 'buckled' by 0.30 AA, while the second layer shows a slight pairing between adjacent rows. The two topmost interlayer spacings are contracted by 10 and 3.5%, respectively, compared with the bulk values.
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Feder et al. (1979) studied this question.
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