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Impedance Spectroscopy (IS), a well-established technique in electrochemistry, is applied in this work to investigate Total Ionizing Dose (TID) effects on Low-Voltage Differential Signaling (LVDS) receivers widely used in high-speed serial links. These devices were irradiated with 60 Co gamma rays at a dose of 15.4 kGy with a dose rate of 364 Gy/h. Measurements of the current drawn by the receivers, and key waveform parameters such as amplitude, rise time, fall time, and bit error rate, showed no differences before and after irradiation. However, IS analysis, complemented by I-V measurements, identified radiation-induced changes that are generally difficult, or even impossible, to detect with traditional methods. IS enabled the modeling of different device sections through equivalent circuits based on two time constant networks, revealing TID effects both in the power rail, in the Electrostatic Discharge (ESD) protection circuit, as well as in the differential input pair and output buffer. This work shows that IS is a promising technique to investigate radiation effects on solid-state devices. • Total dose effects induced by 60 Co gamma rays are investigated in Low Voltage Differential Signaling (LVDS) receivers. • Impedance spectroscopy has been used to study radiation effects on BiCMOS integrated circuits. • Modeling based on two time constant networks enabled the distinguishing of different physical processes. • This study revealed subtle phenomena in the irradiated devices that are useful for selecting components in applications with radiation.
Casolaro et al. (Wed,) studied this question.