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Low temperature charge transport in vanadium oxide (VOx) thin films processed using pulsed dc sputtering is investigated to understand the correlation between the processing conditions and electrical properties. It is identified that the temperature dependent resistivity ρ(T) of the VOx thin films is dominated by a Efros–Shklovskii variable range hopping mechanism Efros and Shklovskii, J. Phys. C 8, L49 (1975). A detailed analysis in terms of charge hopping parameters in the low temperature regime is used to correlate film properties with the pulsed dc sputtering conditions.
Bharadwaja et al. (Mon,) studied this question.