Monolithic integrated wavelength meter demonstrates feasibility of operation in C-Band, suggesting effective integration with photonic devices.
We present a monolithically integrated wavelength meter fabricated on an indium phosphide (InP) platform, suitable for seamless integration with active photonic components such as lasers and optical amplifiers. The device architecture incorporates multiple ring resonators and was realized through a commercial multi-project wafer (MPW) process. Experimental characterization over a 1 nm spectral window using a tunable laser demonstrates the feasibility of the approach and validates the operating principle.
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Volpini et al. (2026) studied this question.
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