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November 3, 2009IEEE Electron Device Letters

Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films

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MPMatthew A. PanzerCarbon180MSMichael ShandalovBen-Gurion University of the NegevJRJeremy RowletteInLight Solutions (United States)

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Panzer et al. (2009) studied this question.

synapsesocial.com/papers/6a666b6a0879daf4d431d929https://doi.org/10.1109/led.2009.2032937
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