Electrically tunable defects in metallic single-walled carbon nanotubes

A defect whose electron transmission probability can be controlled by electric field is intentionally created on a metallic single-walled carbon nanotube (SWCNT) with a voltage pulse from a tip of an atomic force microscope (AFM). Localized characteristics of the created defect are elucidated with local electrical property measurements using an AFM. The result demonstrates that conductance of a metallic SWCNT can be modulated by electric field such as from a back gate with the introduction of a local defect.