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Analysis of the phase shift of ultrasonic waves on reflection at a bonded transducer is extended to the case of thin-film piezoelectric transducers and is complemented by measurements. The certainty of determination of ultrasonic velocities by use of thin-film transducers is shown to be much greater than that attained by bonded-transducer techniques. A direct comparison is drawn between sampled-continuous-wave resonances and pulse-superposition pseudoresonances in ultrasonic samples. To justify this comparison, measurements of ultrasonic transit times in GaAs single crystals have been made by both techniques, using thin-film CdS transducers. The validity of use of the pulse-superposition technique to make accurate measurements of ultrasonic velocities is demonstrated.
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Cottam et al. (1974) studied this question.
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