The thicknesses of thin single-crystal oxide films are determined by integrated intensity measurements in absolute units. The method is illustrated with measurements of Cu/sub 2/O films grown on copper single crystals. Thicknesses determined from two different Bragg maxima agree well with each other, and are reasorably consistent with the thicknesses determined from the line shapes. (auth)
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Borie et al. (1961) studied this question.