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September 1, 1987Journal of Applied PhysicsOpen Access

A comparative study of phase stability and film morphology in thin-film M/GaAs systems (M=Co, Rh, Ir, Ni, Pd, and Pt)

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TST. SandsJet Propulsion LaboratoryVKV. G. KeramidasAT&T (United States)KYK. M. YuNational Sun Yat-sen University

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Sands et al. (1987) studied this question.

synapsesocial.com/papers/6a6f2cbc35aa2c282ce094c3https://doi.org/10.1063/1.339553
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