A description is given of an apparatus for the continuous recording during crystallization of the spherulite radius, in the range of one half micron to a few microns, by scanning the H v scattering pattern. At the same time the apparatus measures the change in intensity of the transmitted depolarized light, which is a measure of the overall rate of crystallization. The theoretical aspects of this measuring procedure are briefly discussed on the basis of light scattering by perfect and imperfect spherulites.
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Antwerpen et al. (1972) studied this question.
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