Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
May 1, 1980Journal of Applied Physics

Structures and SAW properties of rf-sputtered single-crystal films of ZnO on sapphire

View Full Paper
Ask AI
Bookmark
Share

Authors

TMTsuneo MitsuyuPanasonic (Japan)SOShûsuke OnoAichi Institute of TechnologyKWK. WasaHosei University

Discussion

Loading...

Member takes

Overview

Key Points

Key points are not available for this paper at this time.

Cite This Study

Mitsuyu et al. (1980) studied this question.

synapsesocial.com/papers/6a6f4ac3e5469ee92be04cc5https://doi.org/10.1063/1.328019
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 2 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1PREPARATION OF ZnO THIN FILMS BY SPUTTERING OF THE COMPOUND IN OXYGEN AND ARGON1966 · 82 citations
  2. 2Resistivity Measurements on Germanium for Transistors1954 · 685 citations