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An integrated optical circuit containing a laser, passive waveguide, and extra-cavity detector is described. These devices are fabricated from AlxGa1-xAs layers grown by liquid-phase epitaxy. Reflectors are formed by a two-step preferential etch procedure. For proper laser orientation on {100} wafers, the mirrors are found to be oblique, tapered so as to enhance coupling into the underlying passive waveguide; this increases the efficiency of radiation transfer to the detector. Device operation with high differential transfer efficiency and low threshold has been achieved; e.g., for devices with one etched mirror and one cleaved mirror, ηt= 16 percent andJₜ = 2.4kA/cm2, whereas these values areηₜ = 6.5percent and Jt= 3.0 kA/cm2for devices with two etched mirrors. Other orientations on {100} and {110} wafers have also been investigated. The reflectivity of the etched mirrors is small,Rₑ 1-2percent, but transfer efficiencies into the external passive waveguide as large asT = 50percent have been observed. The effect of small Reon device performance is examined both experimentally and theoretically. The fabrication of ribbed interconnections between active circuit components is also described.
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Merz et al. (1979) studied this question.
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