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A new experimental method is presented to investigate correlations of intensity and phase fluctuations within the spectral bandwidth of one longitudinal mode of a semiconductor laser. This intramode correlation spectroscopy can be applied to study the physical processes which contribute to the linewidth of a semiconductor laser. First results for a GaAs/GaAlAs oxide stripe laser reveal the contribution of a low-frequency jitter of the lasing wavelength to the mode linewidth.
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Elsäßer et al. (1985) studied this question.
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