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February 1, 1967Journal of Applied Physics

Relations between Electrical Noise and Dislocations in Silicon

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Authors

KYK. K. YuAJA.G. JordanJames S. McDonnell FoundationRLR. L. LonginiCenter for Strategic and International Studies

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Yu et al. (1967) studied this question.

synapsesocial.com/papers/6a6f77c684cc45bb7bdfa0c6https://doi.org/10.1063/1.1709377
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