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A new algorithm is presented for the calculation of TEM parameters of microstrips, based on a lumped-circuit model of the microstrip transverse static field. The use of such an algorithm allows one to obtain either very high accuracies or very low computer times when ordinary accuracies are tolerated. Compared with the similar technique by Lennartsson, the analysis method presented here allows substantial reduction in computer time, storage, and errors.
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A. Premoli (1975) studied this question.
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