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July 15, 1992Journal of Applied Physics

A physics-based fitting and extrapolation method for measured impact ionization coefficients in III-V semiconductors

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HCHin-Fai ChauUniversity of MichiganDPDimitris PavlidisGeneral Hospital of Athens G. Genimatas

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Chau et al. (1992) studied this question.

synapsesocial.com/papers/6a6fbd718031ec7bb1dbec3ehttps://doi.org/10.1063/1.351884
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