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It has been known for more than 60 years that fine metal whiskers can spontaneously form at the surface of a stressed metal, and that these whiskers produce random failures in computer servers, satellites, and electronic storage devices. A new study attributes the whiskers to minute electric field variations at metal surfaces, leading to the first predictive theory for whisker growth and length distribution.
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В. Г. Карпов (2014) studied this question.
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