Switching field variation in patterned submicron magnetic film elements

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In this article, a micromagnetic study of magnetic switching properties on submicron scale single layer and multilayer thin film elements is presented. Even at deep submicron scale, there exist various edge domain configurations at the saturation remanent state. It is found that the switching field of these patterned film elements can strongly depend on these edge domain configurations. If the edge domains are not controlled, switching field of a patterned magnetic film element can vary significantly during repeated switching processes.