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Properties of thin evaporated films of MgF2 and of CaSiO3 on glass were studied. Thicknesses of the films were determined from measurements of reflected intensity as a function of wave-length, and indices of refraction computed. Density measurements were carried out for MgF2 films. All these properties were found to be different from those of the corresponding bulk materials, and furthermore, the properties of the films change with time. Results are given for indices of refraction, densities, and aging effects.
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Joseph L. Rood (1949) studied this question.
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