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March 1, 1979Journal of Applied Physics

Measurement of grain-boundary diffusion at low temperatures by the surface accumulation method. I. Method and analysis

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JHJames C. M. HwangCornell UniversityRBR. W. BalluffiMoscow Institute of Thermal Technology

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Hwang et al. (1979) studied this question.

synapsesocial.com/papers/6a706f3d84cc45bb7bdfc2dahttps://doi.org/10.1063/1.326168
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