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October 1, 1968Journal of Applied Physics

A Technique for Trap Determinations in Low-Resistivity Semiconductors

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Authors

LWLeonard R. WeisbergOffice of the Secretary of DefenseHSH. SchadeCity College of New York

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Weisberg et al. (1968) studied this question.

synapsesocial.com/papers/6a70fe35439bab0cabc368edhttps://doi.org/10.1063/1.1655936
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