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Thermal stability of the electroluminescent (EL) devices using various hole-transporting materials based on triphenylamine, and a typical emitting material, tris(8-quinolinolato) aluminum has been systematically studied. The thermal stability of the EL devices is clearly seen to depend on the glass transition temperature (Tg) of the hole-transporting material. The highest thermal stability up to 155 °C is obtained in the device using the pentamer of triphenylamine. It has been found that the linear linkage of triphenylamine is useful to attain high Tg rather than the branch linkage.
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Tokito et al. (1997) studied this question.
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