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May 13, 1976Electronics Letters

Simple method of measuring drift-mobility profiles in thin semiconductor films

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Authors

RPR.A. PucelRTX (United States)CKC.F. KrummRTX (United States)

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Pucel et al. (1976) studied this question.

synapsesocial.com/papers/6a718774e5469ee92be2044ehttps://doi.org/10.1049/el:19760186
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  1. 1Determination of impurity and mobility distributions in epitaxial semiconducting films on insulating substrate by <i>C-V</i> and <i>Q-V</i> analysis1974 · 35 citations