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August 16, 1971physica status solidi (a)

Refractive index of GaN

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Authors

EEE. EjderMagnolia Solar (United States)

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Overview

Experimental spectroscopy reveals the refractive index and temperature dependence of gallium nitride, indicating fundamental optical properties for optoelectronic applications.

Key Points

  • To measure the refractive index, optical anisotropy, and temperature dependence of gallium nitride across various photon energies.
  • Conducted optical transmission and reflection measurements on plane-parallel GaN platelets with perpendicular (E ⊥ c) and parallel (E ‖ c) polarizations at varying temperatures up to 300 K.
  • Measured the diffuse reflection spectrum of GaN powder across photon energies to analyze the temperature dependence of the absorption edge.
  • For polarization perpendicular to the c-axis (E ⊥ c) at 300 K, the refractive index measured 2.67 at 3.38 eV and 2.33 at 1.0 eV, with an extrapolated value of 2.29 ± 0.005 at 0 eV.
  • The relative difference in refractive index between E ⊥ c and E ‖ c was 1.5 ± 0.2% at 5000 Å, and the temperature dependence yielded an estimated Debye temperature of approximately 600 K.

Cite This Study

E. Ejder (1971) studied this question.

synapsesocial.com/papers/6a71cff931a3df824329d2d8https://doi.org/10.1002/pssa.2210060212
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