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The transverse coherence of x rays was measured with an intensity interferometer using a 120-microeV-bandwidth monochromator operating at 14.41 keV. By analyzing the transverse coherence profiles, a vertical source profile of a 25-m long undulator of SPring-8, as well as the coherence degradation by a phase object in the beam path, were quantitatively characterized.
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Yabashi et al. (2001) studied this question.
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