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June 1, 1993Journal of Applied Physics

Dependence of electrical properties on film thickness in Pb(ZrxTi1−x)O3 thin films produced by metalorganic chemical vapor deposition

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Authors

YSYukio SakashitaFujifilm (Japan)HSHideo SegawaTokyo Institute of TechnologyKTK. TominagaMeiji University

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Sakashita et al. (1993) studied this question.

synapsesocial.com/papers/6a73b8fcc0a696a45e1afa43https://doi.org/10.1063/1.353936
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  4. 4Dielectric and Optical Properties of KTaO<sub>3</sub>1976 · 66 citations
  5. 5Controlling the Crystal Orientations of Lead Titanate Thin Films1991 · 95 citations