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October 1, 1997Surface Review and Letters

Ultrahigh Vacuum Atomic Force Microscopy: True Atomic Resolution

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Authors

RLR. LüthiIBM Research - ZurichEMErnst MeyerUniversity of BaselMBM. BammerlinIBM (United States)

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Lüthi et al. (1997) studied this question.

synapsesocial.com/papers/6a749088f2cd31a1fadbda0dhttps://doi.org/10.1142/s0218625x9700122x
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