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September 9, 2002Applied Physics Letters

Direct tunneling leakage current and scalability of alternative gate dielectrics

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YYYee‐Chia YeoAgency for Science, Technology and ResearchTKTsu-Jae KingLawrence Berkeley National LaboratoryCHChenming HuUniversity of California, Riverside

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Yeo et al. (2002) studied this question.

synapsesocial.com/papers/6a784fd798f24dbf64bdc3e0https://doi.org/10.1063/1.1506941
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