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September 15, 1978Applied Physics Letters

Measurement of surface recombination velocity in semiconductors by diffraction from picosecond transient free-carrier gratings

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CHC. A. HoffmanWorcester Polytechnic InstituteKJK. JarašiūnasVilnius UniversityHGH. J. GerritsenBrown University

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Hoffman et al. (1978) studied this question.

synapsesocial.com/papers/6a7ad2e54c448619ca0e50fchttps://doi.org/10.1063/1.90428
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