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Probed length scales of submicrometre dimensions have been achieved in x-ray photoelectron spectroscopy using synchrotron light sources. This has contributed to advancing the frontiers of surface and interface research, providing spatially resolved information for complex heterogeneous systems. This paper overviews the present status and capabilities of synchrotron radiation scanning photoelectron microscopy. The information that can be obtained by examining the chemical and electronic properties of laterally heterogeneous systems and processes occurring at microscopic scales will be demonstrated by using selected recent data for semiconductor surfaces and interfaces and model catalyst systems.
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М. Кискинова (2000) studied this question.
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