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March 1, 1991Japanese Journal of Applied PhysicsOpen Access

Reliability of 780-nm High-Power Laser Diodes with Thin Quantum Well Active Layer

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SNShin‐ichi NakatsukaYao Tokushukai General HospitalSYSigeo YamashitaHitachi (Japan)KUKenji UchidaTokyo Medical University

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Nakatsuka et al. (1991) studied this question.

synapsesocial.com/papers/6a7f351e718b82e67116c072https://doi.org/10.1143/jjap.30.493
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