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A magneto-optical ellipsometer is described which uses polarization modulation and the longitudinal magneto-optical Kerr effect. The ellipsometer allows a full determination of the optical and magneto-optical constants of magnetic materials, as well as the registration of in-plane hysteresis loops. The latter application is illustrated on a Ni80Fe20 thin-film sample.
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Nederpel et al. (1985) studied this question.
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