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March 1, 1982IEEE Transactions on Electron Devices

Noise spikes in digital VLSI circuits

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Abstract

An analysis is presented of the appearance of occasional noise spikes in very complex VLSI circuits. The noise spikes may cause so-called soft errors if the operating frequency is high and the variations in channel resistance large. The main contributing noise source is capacitive and inductive crosstalk. Noise spikes in present-day circuits are about an order of magnitude smaller than spikes caused by radioactive decay of trace elements in the encapsulation, and by cosmic rays. Fault-tolerant circuit design reducing the influence of radioactive and cosmic ray bombardment will help against noise spikes as well. A comparison is made with noise spikes in neurons.

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Cite This Study

J. T. Wallmark (1982) studied this question.

synapsesocial.com/papers/6a82a71c57df60cfb510b683 https://doi.org/10.1109/t-ed.1982.20722

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