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As we begin to see what could be the end of the silicon revolution and a transition to a nanotechnology/carbon based electronics era, it is clear that we need to develop new measurement techniques and tools. The continued scaling of electronics creates new problems that must be measured and understood before any kind of commercialization and mass production can take place. Using the measurement triad of DC I-V, CV, and the new Ultra-fast I-V provided in the aforementioned characterization tool increases the potential for new discoveries to be made in the challenging world of semiconductor scaling and nanoscience.
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Jonathan Tucker (2011) studied this question.
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