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October 1, 1970Applied Physics Letters

A New Method for Determination of Deep-Level Impurity Centers in Semiconductors

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YZYasuhito ZohtaTokyo University of Technology

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Yasuhito Zohta (1970) studied this question.

synapsesocial.com/papers/6a82d9bf8ddd99b9b523b08dhttps://doi.org/10.1063/1.1653403
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