Structural and electron diffraction data for sapphire (α‐al₂o₃)

Crystallographic and electron diffraction data for sapphire (α‐Al 2 O 3 ) are presented which enable ready and unique identification of TEM diffraction patterns and facilitate image analysis. Crystallographic data is presented in the form of stereographic projections and in figures listing angles between planes and angles between zones. Electron diffraction data consist of computer‐simulated diffraction patterns and tables of extinction distances calculated using atomic and ionic electron scattering factors.