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February 1, 1996IEEE Photonics Technology Letters

Measurements of a semiconductor waveguide using a low-coherence interferometric reflectometer

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KKK. KasayaNTT (Japan)YYY. YoshikuniKitasato UniversityHIHiroyuki IshiiAkita Industrial Technology Center

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Kasaya et al. (1996) studied this question.

synapsesocial.com/papers/6a830b5f332c0e417ef46636https://doi.org/10.1109/68.484257
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