Low leakage current density (as low as 10/sup -8/ A/cm/sup 2/ at an applied voltage of 5 V) and high breakdown electrical field (larger than 4.5 MV/cm) of the liquid phase chemical-enhanced oxidized GaAs insulating layer enable application to the GaAs MOSFET. The oxide layer is found to be a composite of Ga/sub 2/O/sub 3/, As, and As/sub 2/O/sub 3/. The n-channel depletion mode GaAs MOSFET's are demonstrated and the I-V curves with complete pinch-off and saturation characteristics can be seen. A transconductance larger than 30 mS/mm can be achieved which is even better than that of MESFET's fabricated on the same wafer structure.
No takes yet. Share an insight, caveat, or question.
Wu et al. (1999) studied this question.
Synapse has enriched 5 related papers. Consider them for comparative context: