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January 1, 1992Journal of Applied Physics

Optoelectronic measurement of semiconductor surfaces and interfaces with femtosecond optics

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Authors

XZX.-C. ZhangTianjin University of Science and TechnologyDAD. H. AustonUniversity of California, Santa Barbara

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Zhang et al. (1992) studied this question.

synapsesocial.com/papers/6a83209b7a9386604693c87fhttps://doi.org/10.1063/1.350710
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