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Current-voltage data for metal-oxide varistors are presented in the temperature range 4.2–420 °K. These results and other general observations concerning varistor behavior are used to help decide which of the several mechanisms employed to explain varistor conduction are indeed applicable. We conclude that a tunneling process is the only viable mechanism so far proposed to qualitatively describe conduction at breakdown.
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Philipp et al. (1977) studied this question.
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