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July 31, 1989Applied Physics Letters

Characteristics of rare-earth element erbium implanted in silicon

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Authors

YTY. S. TangUniversity of Science and Technology of ChinaKHKC HeasmanUniversity of SurreyWGW. P. GillinQueen Mary University of London

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Tang et al. (1989) studied this question.

synapsesocial.com/papers/6a83b73fd65172829ee65a8ehttps://doi.org/10.1063/1.101888
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