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April 1, 1981Applied Optics

Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,Rm) technique

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AHA. HjortsbergU.S. National Science Foundation

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A. Hjortsberg (1981) studied this question.

synapsesocial.com/papers/6a8432f0002ab1506fb2a225https://doi.org/10.1364/ao.20.001254
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