Electron crystallography of epitaxially grown paraffin

Three‐dimensional electron diffraction data from the epitaxially crystallized paraffin n ‐C 36 H 74 are investigated in a structure analysis and are found to give a reasonable image of the structure, in agreement with the earlier x‐ray determination. An inconsistency in the refined isotropic temperature factors from different zonal projections, however, indicates the necessity for a more accurate physical model for epitaxially grown crystals which will account for a large spread of diffraction peaks along reciprocal lattice lines parallel to the projection axis.