The electron interference method is discussed which enables to measure the distribution of magnetization in a magnetic thin film. The phase distribution of the transmitted electron wave just behind the film has the information of the magnetization, so one can measure the magnetization from the interference pattern (hologram) between object wave and reference wave. Interference patterns are calculated when 180° domain walls in a ferromagnetic thin film are crossed with the electron biprism. The phase change of transmitted wave corresponding to the magnetization distribution of 180° domain walls was experimentally detected by this method, and the observed interference patterns agreed qualitatively with those calculated.
No takes yet. Share an insight, caveat, or question.
Akira Tonomura (1972) studied this question.