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February 1, 1982Physical Review Letters

Synchrotron X-Ray Diffraction Study of Silicon during Pulsed-Laser Annealing

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Authors

BLB. C. LarsonOak Ridge National LaboratoryCWC. W. WhiteColorado School of MinesTNT. S. NoggleOak Ridge National Laboratory

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Larson et al. (1982) studied this question.

synapsesocial.com/papers/6a8470fb002ab1506fb2b679https://doi.org/10.1103/physrevlett.48.337
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