The uniaxial strain dependence of the critical current was examined for YBCO coated conductors with IBAD-CeO 2 /YSZ or ISD-MgO buffer layers on Hastelloy substrates. I c increased with increasing applied strain, reached a maximum and decreased for higher strain values. The reversible strain region of I c variation was observed. The reversible strain limit depends on the buffer layers. For the CeO 2 /YSZ buffered tape, I c recovered the initial value even after the applied strain reached 0.30%. On the other hand, an irreversible degradation of I c was observed at the strain less than 0.22% for the MgO buffered tape. The overall relationship between the I c normalized by the peak value and the intrinsic strain in YBCO obeyed a unified scaling function. Quenching occurred at the strain close to the yield strain of the Hastelloy substrate.
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Sugano et al. (2005) studied this question.