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June 1, 1974Journal of the Optical Society of America

Effects of component optical activity in data reduction and calibration of rotating-analyzer ellipsometers

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DAD. E. AspnesNorfolk State University

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D. E. Aspnes (1974) studied this question.

synapsesocial.com/papers/6a85875868d2ad262cd59917https://doi.org/10.1364/josa.64.000812
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  1. 1An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique1969 · 616 citations
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  4. 4Calibration of Ellipsometer Divided Circles*1971 · 15 citations
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