The growth of a single crystal of 3C-SiC on a Si substrate by the MBE method has been performed. A single-crystal film can be grown at a substrate temperature T sub =1150°C. This temperature is relatively low compared to that used in other methods. The diffused Si from a substrate plays an important part in the crystal growth of SiC, especially for a very thin film. The individual intensity of Si and C molecular beams ( J Si and J C ) and their intensity ratio J Si / J C should be selected with suitable values in accordance with the film thickness, considering the growth condition of the MBE method.
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Kaneda et al. (1986) studied this question.
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