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This paper first reviews the properties of silicon carbide, in which polytypism is a salient feature. If a highly compensated insulating polytype is sandwiched between low resistive polytypes, space-charge injection will occur. The theory of space-charge-limited current flow in the presence of traps is reviewed and a somewhat different version of the standard theory is presented, which shows more clearly the ohmic and space-charge-limiting regimes. Close analytical parametric forms for I and V are obtained. Experimental data on I-V characteristics and impedance are presented for 52–300 K. Except at the highest temperature, four regimes are clearly visible in the I-V curves. A quantitative comparison with the theory is made and various transport quantities for α-SiC are deduced.
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Tehrani et al. (1985) studied this question.
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