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November 1, 1966IEEE Transactions on Electron Devices

The mechanism of self-healing electrical breakdown in MOS structures

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NKN. KleinCentro Brasileiro de Pesquisas Físicas

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N. Klein (1966) studied this question.

synapsesocial.com/papers/6a86812227bc8e2c31cc6d87https://doi.org/10.1109/t-ed.1966.15844
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